LED&Lighting Flicker Measurement Systems

Tenme provides TLM(Temporal Light Modulation)Test System based on LFA-3000 and TLM Test special power supply can realize the measurement and analysis of TLM under various voltage fluctuation conditions,and the system has a built-in standard voltage waveform database,which can complete IEC 61547-1 measurement by one-click operation, which is convenient and fast, and fully meets the requirements of TLM test and analysis in various stages of lighting product development, production, QC and application.
System integrate with the latest international standards and technical reports which can provide all kinds of flicker index and automatically classify the risk level of flickering according to various international standards. Specially designed for field and laboratories’ lighting environments, test and evaluate time domain and frequency domain analysis chart of light flickering, fundamental frequency, percent of flicker(PF), flicker index(FI), modulation depth(MD), the percentage of modulation(CEC standard), (IEC 61547), Mp(ASSIST method), SVM(CIE, TC).
Main Features
- The built-in standard voltage waveform database and customized voltage waveform fully meet the test requirements of IEC 61547-1.
- CSV data files of arbitrary waveform can be imported to simulate and analysis the TLM under various lighting conditions.
- The sampling rate up to 100kHz can meet the requirements of various standards.
- The linear dynamic range of 8 orders of magnitude can capture the fine waveform of rapidly changing light sources,which is suitable for the measurement and analysis of various dimming products.
Typical Application Scenarios
